The lattice constants of the films increase and the diffraction peaks shift to low direction 薄膜的電學性質發生明顯變化,面電阻率降至106
The dependency of tic content versus relative intensity of x - ray diffraction peak was also studied K值法研究確定了tic含量與xrd衍射峰相對強度的關系。
One diffraction peak of the secondary phase was found in the xrd spectrum of sample annealing at 850 for 15s 在850 + 15s退火處理的樣品中發現了第二相形成的衍射峰。
It is verified that the oxide have obvious characteristic diffraction peaks and less impurity by x - ray diffraction ( xrd ) X射線衍射( xrd )分析表明,制備出的氧化物樣品特征衍射峰明顯,雜質含量少。
The diffraction peak angle does n ' t change obviously as co / fe ratio , it is attributed to the radius of co fe ions are fairly similar , so the influence of substitutions on unit cell is small 而隨著co fe比的變化,衍射峰角度值變化不明顯,這是由于co 、 fe離子半徑相差不大,它們之間的位置取代對晶胞的整體影響相對較小。